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Type: Improvement
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Resolution: Won't Do
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Priority: Major - P3
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None
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Affects Version/s: None
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Component/s: None
Summary
Reduce the stress tests on ARM to a smaller subset and/or lower frequency that gives optimal coverage while being mindful of the machine cost and availability.
Motivation
WT-8913 introduced stress tests on ARM. For now, to aid the discovery of any corruption bugs, we are running the whole stress suite on the platform. Eventually, we should aim to run a smaller set of tests that offer good test coverage. This is considering the cost and availability of the ARM machines.
- Is this issue urgent?
No
- is caused by
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WT-8913 Add a new build variant for stress testing on the ARM platform
- Closed